iKon-L 936

Andor’s iKon-L High Dynamic Range CCD camera offers outstanding resolution, field of view, sensitivity and dynamic range performance. It boast a proprietary large area 5-stage TE cooler enabling cooling of this large area sensor down to an unprecedented -100°C without the aggravation of liquid nitrogen.
iKon-M 934

Andor’s iKon-M 934 low noise CCD camera series are designed to offer the ultimate in high-sensitivity, low noise performance, ideal for demanding imaging applications. These high resolution 1024 x 1024 CCD cameras boast up to 95% QEmax, high dynamic range, and 13 μm pixels.
PV Inspector

Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR
TuCam

Andor’s TuCam is a new generation two-camera adapter for macro or microscopic imaging applications. Available in C- or CSUX-mount, TuCam features include large aperture, exceptional transmission, very low distortion and high precision alignment using kinematic cassettes
Biorit ICD 20x

Novi Biorit ICD je uspešna kombinacija ugodne cene, visoke kakovosti in uporabne opreme.
Science MTL-201 50x-800x

Bresser Science MTL 201 je poseben mikroskop z odsevano svetlobo, ki omogoča opazovanje netransparentnih površin pri večjih povečavah (50x-800x). Ta trdno zasnovan instrument je idealen za delo v metalografiji (npr. mikroskopiranje poliranih vzorcev kovin ali zlitin), mineralogiji, natančnem inženirstvu in elektroniki.
Advance ICD 10x-160x

BRESSER Advance ICD je prvi trinokularni stereo in biološki mikroskop v seriji BRESSER s povečavo do 160-krat po neverjetni ceni.
Researcher ICD LED 20x-80x

To je univerzalni instrument med mikroskopi BRESSER. Stereo mikroskop, ki je izdelan v visoki kakovosti, ponuja tudi možnost biološkega sloga. Ta model ima zgornjo in spodnjo osvetlitev za vsako vrsto mikroskopiranja, ki ga lahko upravljate samostojno ali skupaj.
Eclipse L200N Series

200mm wafer and mask inspection microscope systems for reflected light defect identification.