Eclipse LV-DAF
An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.
Eclipse LV150NL
A new industrial microscope designed especially for episcopic illumination applications.
ZEISS Victory Harpia spektivi
Svet narave in ptic je že zares fascinanten, če ga opazujemo s prostim očesom. Toda ogled skozi Victory® Harpia se spremeni v povsem novo izkušnjo.
NWL200
Advanced IC inspection wafer loader capable of loading 100µm thin wafers.
